Impulse Noise Simulator (INS Series) Impulse Noise Simulator INS-S100

Parameter Specifications
Pulse output voltage 0. 05kV ~ 1. 00kV ±10% 0. 01kV step ※1
Parameters can be changed during pulse output
Pulse width 50ns±15% 100ns ~ 1000ns ±10% 50ns step ※1
Repetition cycle 10ms ~ 999ms ±10% 1ms step
Rise time < 3ns ※1
Polarity + / -
Output impedance 50Ω ※2
Terminal resistance 50Ω
Pulse
repetition
modes
VARIABLE 10ms ~ 999ms
EXT TRIG Input connector: BNC Operating cycle: > 10ms
Input signal level:TTL / open collector negative logic
Pulse width:> 1ms
1 SHOT Single pulse generation each time the 1 SHOT button is pressed.
In PHASE mode, output is synchronized to the set phase angle
Test time 1s ~ 999s ±10% 1s step
HV coaxial cable connector NMHV ※3
External control Communication function RS-232C compliant optical communication
Power supply AC100V ~ 240V ±10% 50Hz / 60Hz ±10%
Dimensions / weight (W)430×(H)199×(D)370mm
(protrusions excluded) / approx. 11kg
Accessories coaxial cable 30cm (02-00155A):2pcs, SG short plug (02-00106A): 1pc,
SG cable (05-00103A): 1pc, outlet panel:1pc, AC cable:1pc,
Instruction Manual:1 volume, accessories bag:1pc

Description

INS-S100 Impulse Noise Simulator

Test Noise Immunity with Confidence

The INS-S100 Impulse Noise Simulator helps engineers evaluate the noise resistance of electronic products during design, development, and troubleshooting.

It reproduces high-frequency impulse noise commonly generated by switching devices, relays, contact discharges, and electric motors. This allows engineers to identify potential issues early and improve product reliability before market release.

With pulse outputs starting from 50V, the INS-S100 is ideal for testing circuit boards, low-voltage electronics, embedded systems, industrial equipment, and automotive components.

Key Advantages

Low-Voltage Pulse Testing

Generate impulse noise from 50V to evaluate the immunity of sensitive electronic circuits and low-voltage devices.

Easy Noise Threshold Analysis

Adjust the output voltage during testing to quickly identify the noise level that affects product performance.

Built-In Test Time Function

Set the test duration directly on the instrument for fast, repeatable, and consistent testing.

Compact and Portable

The INS-S100 features a lightweight design without a built-in Coupling/Decoupling Network (CDN), making it easy to transport and operate.

Signal Line Immunity Testing

Use optional coupling adapters to inject noise into communication and signal lines for comprehensive EMC evaluation.

Circuit Board Noise Evaluation

Optional radiation probes allow direct testing of printed circuit boards (PCBs) and electronic assemblies.

Typical Applications

  • Electronic Circuit Board Testing
  • EMC and EMI Pre-Compliance Testing
  • Automotive Electronics Validation
  • Industrial Control Systems
  • Consumer Electronics Development
  • Embedded System Testing
  • Product Reliability Evaluation
  • Failure Analysis and Troubleshooting

Why Choose the INS-S100?

The INS-S100 offers a simple and effective way to assess noise immunity during product development.

Its low-voltage pulse capability, compact design, and flexible testing options help engineers:

✔ Improve product reliability
✔ Detect design weaknesses early
✔ Reduce field failures
✔ Accelerate development cycles
✔ Enhance EMC performance

Whether you are developing a new product or investigating a field failure, the INS-S100 provides the tools needed to perform accurate and reliable impulse noise testing.

 

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